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Thursday, March 16, 2023 - 8:00 AM
to Tuesday, December 31, 2030 - 5:00 PM
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Helps clients automate, connect, and analyze semiconductor manufacturing data. The software features Statistical Process Control (SPC semiconductor), Part Average Testing (PAT), and wafer mapping, among others, and is highly configurable to meet the needs of various semiconductor manufacturing applications. With yieldWerx, clients can achieve cost-effective solutions for handling semiconductor manufacturing and engineering data analysis, leading to enhanced product quality and increased yield.
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Website: https://go.evvnt.com/1618952-0
